Nova Measuring Instruments (NASDAQ:$NVMI) has announced that one of their metrological systems has been chosen by the world’s leading foundry. The system in question, their most advanced XPS platform, was selected to be used for inline application and is to be deployed across their advanced technology nodes.
Nova designs and manufactures a number of products aimed at providing metrology solutions for the semiconductor manufacturing industry. As the current world’s largest integrated circuit manufacturer, Nova’s products aim to deliver effective process control throughout the semiconductor fabrication lifecycle.
The system is called the VeraFlex III XF. It is the latest generation of the VF XPS series. The company boasts that the system offers great sensitivity to sub-angstrom thickness and composition characterization used for monitoring critical processes. An example of these processes would be the atomic layer deposition – or ALD – at the most advanced Logic nodes.
“The selection of VeraFlex III XF by this customer highlights the value XPS brings to advanced process control in our customers’ highly scaled technology nodes,” says Glyn Davies, Executive Vice President and Nova’s Material Metrology Division General Manager.
“This new order offers yet more proof of our position as the leading provider of X-ray metrology solutions to semiconductor customers. We are excited by the progress made this year with both leading Memory and Foundry customers, which supports our strategy to increase XPS inline metrology steps and expand the overall available market,” he added.
Almost every semiconductor manufacturer’s process control strategy currently employs the VeraFlex product family of XFS metrology tools. Revenue from the sale will be recognized during the 3rd quarter.
Featured Image: novameasuring.com
